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Scientific publications authored or co-authored by J. Krupka

Books and Book Chapters

  1. J. Krupka, "Methods of analysis and selected properties of microwave resonant structures”, Thesis for habilitation degree, Warsaw University of Technology 1989

  2. J. Krupka "Zbiór zadań z teorii pola elektromagnetycznego", WNT-Warszawa, 1990, Chapter 13 and supplement

  3. J. Krupka and W Glogier, Chapter 8: "Microwave Ferrite Devices" in "Handbook of Microwave Technology", Editor: T.K. Ishii, Academic Press Inc., San Diego, New York, Boston, London, Sydney, Tokyo, Toronto, Vol.I, pp.235-260, 1995

  4. J. Krupka, R. Morawski i L. Opalski, "Metody numeryczne dla studentów elektroniki i technik informacyjnych" - Skrypt WPW, 1997. 1/3 of the book

  5. J. Krupka, R. Morawski i L. Opalski, "Wstęp do metod numerycznych dla studentów elektroniki i technik informacyjnych" - Podręcznik WPW, 1999. 1/3 of the book

  6. J. Krupka and R. Geyer, Chapter 3915/IM: "Loss angle measurement", vol.11, pp. 606-619 Wiley Encyclopedia of Electrical and Electronics Engineering, John Wiley & Sons, Inc., Publishers, 1999

  7. J. Krupka, A. Miękina, R. Morawski i L. Opalski, "Wstęp do metod numerycznych dla studentów elektroniki i technik informacyjnych" - Podręcznik WPW, 2009. 1/4 of the book.

Papers in International Journals

  1. J. Krupka and A. Milewski, "Assessment of the possibilities of applying approximate analysis method to measurement of complex permittivity in TE 01n mode cavities", J. Phys. E: Sci. Instrum. vol.12, pp.391-396, 1979

  2. S. Dmowski, J. Krupka and A.Milewski, "Contactless measurement of silicon resistivity in cylindrical TE 01n mode cavities", IEEE Trans. Instrum. Meas.vol.IM-29, pp.67-70, March 1980

  3. A. Kędzior and J. Krupka, "Application of the Galerkin method for determination of quasi TE 0mn mode frequencies of a rectangular cavity containing a dielectric sample", IEEE Trans. Microwave Theory Tech ., vol. MTT-30, pp.196-198, Feb. 1982

  4. J. Krupka, "Optimization of electrodynamic basis for determination of the resonant frequencies of microwave cavities partially filled with a dielectric", IEEE Trans. Microwave Theory Tech., vol. MTT-31, pp.302-305, March 1983

  5. J. Krupka, "Computations of frequencies and intrinsic Q factors of TE 0mn modes of dielectric resonators", IEEE Trans. Microwave Theory Tech., vol. MTT-33, pp.274-277, March 1985.

  6. J. Krupka, "Properties of shielded cylindrical quasi-TE 0nm -mode dielectric resonators", IEEE Trans. Microwave Theory Tech., vol. MTT-36, pp.774-779, April 1988

  7. J. Krupka, "Magnetic tuning of cylindrical H01d mode dielectric resonators", IEEE Trans. Microwave Theory Tech vol. MTT-37, pp. 743-747, April 1989

  8. J. Krupka, "Resonant modes in shielded cylindrical ferrite and single crystal dielectric resonators" IEEE Trans. Microwave Theory Tech. vol. MTT-37, pp. 691-697, April 1989

  9. J. Krupka, "Measurements of all permeability tensor components and the effective linewidth of microwave ferrites using dielectric ring resonators", IEEE Trans. Microwave Theory Tech. vol. MTT-39, pp.1148-1157, July 1991

  10. J. Krupka, M. Klinger, M. Kuhn, A. Baranyak, M. Stiller, J. Hinken and J. Modelski, "Surface resistance measurements of HTS films by means of sapphire dielectric resonators", IEEE Trans. on Applied Superonductivity, vol.3, No. 3,pp. 3043-3048, Sept. 1993

  11. J. Krupka, D. Cros, M. Aubourg and P. Guillon, "Study of whispering gallery modes in anisotropic single crystal dielectric resonators",IEEE Trans. Microwave Theory Tech. vol. MTT-42, pp.56-61, January 1994

  12. J. Krupka, R.G. Geyer, M. Kuhn and J. Hinken, "Dielectric properties of single crystal Al2O3, LaAlO3, NdGaO3, SrTiO3,and MgO at cryogenic temperatures and microwave frequencies", IEEE Trans. Microwave Theory Tech, vol.42, pp. 1886-1890, October 1994

  13. J. Ceremuga, J.Krupka, R.G. Geyer, and J.Modelski, "Influence of film thickness and air gaps in surface impedance measurements of high temperature superconductors using the dielectric resonator technique", IEICE Transactions on Electronics, No. 8, pp.1106-1110, Japan, August 1995

  14. R.G. Geyer andJ.Krupka, "Microwave dielectric properties of anisotropic materials at cryogenic temperatures", IEEE Trans. Instrum. Meas., vol. 44, pp.329-331, No.2, April 1995

  15. J. Ceremuga, J. Krupka, and T. Kościuk, "Resonant measurements of surface resistance of high-Tc superconducting films: how good or bad are they", Journal of Superconductivity, vol.8, No.6, pp.681-689, 1995

  16. J.Krupka and R.G. Geyer, "Complex permeability of demagnetized microwave ferrites near and above gyromagnetic resonance", IEEE Trans. on Magnetics, pp.1924-1933,May 1996

  17. J.Krupka, P. Blondy, D. Cros, P. Guillon, and R. Geyer, "Whispering gallery modes in magnetized disk samples and their applications for permeability tensor measurements of microwave ferrites at frequencies above 20 GHz", IEEE Trans. on Microwave Theory Tech, vol. MTT-44, pp.1097-1102, July 1996

  18. J. Krupka, D. Cros, A.Luiten, and M. Tobar, "Design of very high Q sapphire resonators", Electronics Letters, vol.32, No 7, pp.670-671, UK, 1996

  19. M. E. Tobar, J. Krupka, E.N. Ivanov, R.A. Woode, "Dielectric frequency-temperature compensated whispering gallery mode resonators", Journal of Physics D - Appl. Phys., vol.30, Iss. 19, pp. 2770-2775, 1997

  20. F.J.B. Stork, J.A. Beall, A. Roshko, D.C. DeGroot, D.A. Rudman, R.H. Ono, and J.Krupka, "Surface resistance and morphology of YBCO films as a function of thickness", IEEE Trans. on Applied Superconductivity, vol.7, pp.1921-1924, June 1997

  21. J.Krupka, K. Derzakowski, B. Riddle and J. Baker-Jarvis, “A dielectric resonator for measurements of complex permittivity of low loss dielectric materials as a function of temperature”, Measurements Science and Technology, vol.9, pp.1751-1756, Oct.1998

  22. M. E. Tobar, J. Krupka, E.N. Ivanov, R.A. Woode, "Anisotropic complex permittivity measurements of mono-crystalline rutile between 10 and 300 K ", Journal of Applied Physics, vol.83, no.3, pp.1604-1609, 1998

  23. J. Krupka and J. Mazierska, "Improvement of accuracy in measurements of the surface resistance of superconductors using dielectric resonators", IEEE Trans. on Applied Superconductivity, vol.8, Dec. 1998

  24. A.Abramowicz, K. Derzakowski, and J. Krupka, ”Comments on ”Study of whispering gallery modes in double disc sapphire resonators ”, Letter in IEEE Trans. on Microwave Theory Tech, vol. MTT-46, p.566,May 1998

  25. J.G. Hartnett, M.E. Tobar, A.G. Mann, J. Krupka, and E.N. Ivanov, "Temperature dependence of Ti3+ doped sapphire whispering gallery mode resonator", Electronics Letters, vol.34, No 2, pp.195-196, UK, 1998

  26. A.N. Luiten, M. E. Tobar, J. Krupka, R. Woode, E.N. Ivanov, and A.G. Mann, "Microwave properties of a rutile resonator between 2 and 10 K", Journal of Physics D - Appl. Phys., vol.31, pp. 1383-1391, UK 1998

  27. M. E. Tobar, J. Krupka, J. G. Hartnett, E. N. Ivanov, and R. A. Woode, “High-Q sapphire-rutile frequency-temperature compensated microwave dielectric resonators, IEEE Trans. on Ultrasonics, Ferroelectrics and Frequency Control, vol.45, No.3, pp.830-835, May, 1998

  28. J. Baker-Jarvis, R.G. Geyer, J.H. Grosvenor Jr., M.D. Janecic, Ch.A. Jones, B. Riddle, C.M. Weil, and J. Krupka,"Dielectric characterization of low-loss materials", IEEE Trans. on Dielectric and Electrical Insulation, vol.5, No.4, pp.571-577, August 1998

  29. R. Geyer and T. Vanderah and C. Jones and Jerzy Krupka, "Complex permeability measurements of ferrite ceramics used in wireless communications", Ceram. Trans. , vol. 88, pp. 93-111, Published by The American Ceramic Society 1998

  30. J. Krupka, K. Derzakowski, M.E. Tobar, J. Hartnett, and R.G. Geyer, “Complex permittivity of some ultralow loss dielectric crystals at cryogenic temperatures”, Measurement Science and Technology, vol.10, pp.387-392, Oct.1999.- The best paper award for 1999 in Measurement Science and Technology

  31. J. Krupka, K. Derzakowski, A. Abramowicz, M. E. Tobar, and R. G. Geyer “Whispering Gallery Modes for Complex Permittivity Measurements of Ultra-Low Loss Dielectric Materials”, IEEE Trans. on Microwave Theory Tech, vol. MTT-47, pp.752-759, June 1999

  32. J. G. Hartnett, M. E. Tobar, A. G. Mann, E. N. Ivanov J. Krupka, and R. Geyer, “Frequency-temperature compensation in Ti3+ and Ti4+ dopped sapphire whispering gallery mode resonators”, IEEE Trans. on Ultrasonics, Ferroelectrics and Frequency Control, vol.45, No.3, pp.993-1000, July, 1999

  33. J. Krupka, S. A. Gabelich, K. Derzakowski, and B. M. Pierce, “Comparison of split-post dielectric resonator and ferrite disk resonator techniques for microwave permittivity measurements of polycrystalline yttrium iron garnet” Measurement Science and Technology, vol. 10, pp.1004–1008, November 1999

  34. J. Krupka and J. Mazierska, “Single-crystal dielectric resonators for low-temperature electronics applications”, IEEE Trans. on Microwave Theory Tech, vol. MTT-48, pp.1270-1274, July 2000

  35. R. Geyer, J. Krupka and M. Tobar, "Microwave dielectric properties of low-loss materials at low temperature”, Electronic Ceramic Materials and Devices in Ceramic Transactions, vol.106, pp.219-226, Published by The American Ceramic Society, 2000

  36. J.G. Hartnett, M. E. Tobar and J. Krupka, “Complex paramagnetic susceptibility in titanium-doped sapphire at microwave frequencies”, Journal of Physics D: Applied Physics, vol.34, pp.959-967, 2001

  37. J. Krupka, A P Gregory, O C Rochard, R N Clarke, B Riddle and J Baker-Jarvis, “Uncertainty of Complex Permittivity Measurements by Split-Post Dielectric Resonator Technique”, Journal of the European Ceramic Society, vol.21, pp.2673-2676, 2001

  38. J. Krupka and J. Mazierska, “Microwave properties of low-loss polymers at cryogenic temperatures”, IEEE Trans. on Microwave Theory Tech, vol. MTT-50, pp.474-480, February 2002

  39. J.G. Hartnett, A.N. Luiten, J. Krupka, M.E. Tobar and P. Bilski, “Influence of paramagnetic chromium ions in crystalline YAG at microwave frequencies”, Journal of Physics D. Applied Physics Vol.35, pp.1-8, 2002

  40. J.G. Hartnett, M.E. Tobar, D. Cros, P. Guillon, J. Krupka, "High Q-factor Bragg reflection sapphire-loaded cavity TE1,0,d mode resonator", IEEE Trans.UFFC, vol 10, no. 12, pp 1617-1620, 2002

  41. J. Krupka, “Precise measurements of the complex permittivity of dielectric materials at microwave frequencies”, Materials Chemistry and Physics, vol.79, Issues 2-3, 10, pp.195-198, April 2003

  42. J.D. Anstie, J.G. Hartnett, M.E. Tobar, J. Winterflood, D. Cros and J. Krupka, "Characterization of a spherically symmetric fused-silica-loaded cavity microwave resonator", Measurements Science and Technology, vol.14, pp.286-293, 2003

  43. J. Krupka “Developments in techniques to measure dielectric properties of low-loss materials at frequencies of 1–50 GHz”, Journal of the European Ceramic Society, vol.23, pp.2607-2610, 2003

  44. J. Mazierska, M. V. Jacob, A. Harring, J. Krupka,, P. Barnwell, T. Sims “Measurements of loss tangent and relative permittivity of LTCC ceramics at varying temperatures and frequencies”, Journal of the European Ceramic Society, vol.23, pp.2611-2615, 2003

  45. B. Riddle, J. Baker-Jarvis, and J. Krupka, “Complex Permittivity Measurements of Common Plastics over Variable Temperatures”, IEEE Trans. on Microwave Theory Tech, vol. MTT-51, pp.727-733,March 2003.

  46. M. V. Jacob, J. Mazierska, D. Ledenyov, J. Krupka, “Microwave characterization of CaF2 at cryogenic temperatures using a dielectric resonator technique”, Journal of the European Ceramic Society, vol.23, pp.2617-2622, 2003

  47. M. V. Jacob, J. Mazierska, K Leong, D. Ledenyov, and J. Krupka, “Surface resistance measurements of HTS thin films using SLAO dielectric resonator”, IEEE Trans. on Applied Superconductivity, vol.13, pp.2909-2912, June 2003

  48. J. Krupka, J. Mazierska, M. Jacob, J. Hartnett and M. Tobar: “Recent Advances in Measurements of Permittivity and Dielectric Losses at Microwave Frequencies”, Invited Paper, SPIE Proceedings, vol. 5445, pp. 311-317, 2004.

  49. M. V. Jacob, J. G. Hartnett, J. Mazierska, V. Giordano, J. Krupka, and M. E. Tobar, “Temperature dependence of permittivity and loss tangent of Lithium Tantalate at microwave frequencies”, IEEE Trans on MTT vol.52, pp.536-541, Feb. 2004

  50. J. Krupka, A. Abramowicz and K. Derzakowski, „Magnetically Tunable Dielectric Resonators Operating at Frequencies about 2 GHz”, Journal of Physics D: Applied Physics, vol. 37, pp.379-384, Feb. 2004.

  51. V. Giordano, J.Hartnett, J.Krupka, Y. Kersalé, P.-Y. Bourgeois, and M. Tobar, “Whispering gallery mode technique applied to the measurement of the dielectric properties of Langasite between 4K and 300K”, IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, vol.51, pp.484-490, May 2004.

  52. G. Hartnett, M. E. Tobar and J. Krupka, “The dependence of the permittivity of sapphire to thermal deformation at cryogenic temperatures”, Measurement Science and Technology, vol. 15, issue 1, pp.203 – 210, January 2004

  53. A. Fowler, J.Hartnett, M. Tobar, and J.Krupka, “The microwave characterization of single crystal Lithium and Calcium Fluoride at cryogenic temperatures”, IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, vol.51, pp.380-386, April 2004

  54. M. V. Jacob, J. Mazierska, and J. Krupka, “A cryogenic post dielectric resonator for precise microwave characterization of planar dielectric materials for superconducting circuits”, Superconductor Science and Technology, vol.17, pp.358-362, March 2004.

  55. M.E. Tobar, J-M. le Floch, D. Cros, J. Krupka, J.D. Anstie, J.G. Hartnett, “Spherical Bragg Reflector Resonators”, IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, vol.59, pp.1054-1059, September 2004.

  56. M.V. Jacob, J. Mazierska and J.Krupka, Microwave characterization of (La,Sr)(Al,Ta)O3 using TE011 mode dielectric resonator”, Transactions of the Materials Research Society Japan, vol, 29[4], pp.1093-1096, 2004

  57. J. Mazierska, D. Ledenyov, M. V Jacob and J. Krupka,“Precise microwave characterization of MgO substrates for HTS circuits with superconducting post dielectric resonator” Supercond. Sci. Technol. 18 pp.18-23, 2005

  58. J. Krupka, M.E. Tobar, J.G. Hartnett, D. Cros, J-M Le Floch, „Extremely high Q-factor Dielectric Resonators for Millimeter Wave Applications”, IEEE Trans.on MTT, vol.53, pp.702-712, February 2005

  59. J. Krupka, Wei-Te Huang and Mean-Jue Tung “Complex Permittivity Measurements of Low Loss Microwave Ceramics Employing Higher Order Quasi TE0np Modes Excited in a Cylindrical Dielectric Sample”, Measurements Science and Technology, vol 16, pp.1014-1020, 2005

  60. J. Krupka, A. Cwikla, M. Mrozowski, R. N. Clarke and M. E. Tobar, “High Q-factor microwave Fabry-Perot resonator with distributed Bragg reflectors”, IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, vol.52, No.9, pp. 1443-1450, September, 2005

  61. R. G. Geyer, J. Krupka, B. Riddle, and L. A. Boatner “Microwave dielectric properties of single crystal quantum paraelectrics KTaO3 and SrTiO3 at cryogenic temperatures”, Journal of Applied Physics, vol.97, No10, p.104111 (6pages), Part 1, May 15, 2005

  62. Mohan V Jacob, Janina Mazierska and Jerzy Krupka, “Dielectric Properties of Yttrium Vanadate Crystals from 15 K to 25 K”, Journal of Electroceramics (Springer Science), vol.15, pp.237-241, 2005

  63. J.G. Hartnett, M.E. Tobar, E.N. Ivanov and J. Krupka , Room temperature measurement of the anisotropic loss tangent of sapphire using the whispering-gallery-mode technique, IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, vol.53, No.1, pp. 34-38, January, 2006

  64. Tomasz Zychowicz and Jerzy Krupka “Measurements of conductivity of thin metal films”, Proc. SPIE, Vol.6159, pp.482-489, Photonics Applications in Astronomy, Communications, Industry, and High Energy Physics Experiments IV, February 2006

  65. J. Krupka, “Frequency Domain Complex Permittivity Measurements at Microwave Frequencies”, Measurement Science and Technology, vol.17, R55-R77, 2006 (invited paper)

  66. T. Zychowicz, J. Krupka and M. Tobar, „Whispering gallery modes in hollow spherical dielectric resonators”, Journal of the European Ceramic Society, vol.26, pp.2193-2194, 2006

  67. J. Krupka, A. Abramowicz, and K. Derzakowski, „Magnetically tunable filters for cellular communication terminals”, IEEE Trans.on MTT, vol.54, pp.2329-2335, June 2006

  68. M.V. Mohan, J.G. Hartnett, J. Mazierska, J. Krupka and M.E. Tobar, “Dielectric characterisation of Barium Fluoride at cryogenic temperatures using TE011 and quasi TE0mn mode dielectric resonators”, Cryogenics, vol.46, pp.730-735, 2006

  69. M.V. Mohan, J. Krupka, J. Mazierska, and G. Woods, “Cryogenic complex anisotropic permittivity of magnesium fluoride”, Materials Science and Engineering A, vol. 427, pp.175–180, 2006

  70. J. Krupka, Wei-Te Huang and Mean-Jue Tung, „Complex Permittivity Measurements of Thin Ferroelectric Films Employing Split Post Dielectric Resonator“, Ferroelectrics, vol.335, issue 1, pp.89-94, 2006

  71. J. Krupka, T. Zychowicz, V.Bovtun, and S. Veljko, “Complex Permittivity Measurements of Ferroelectrics Employing Composite Dielectric Resonator Technique“, IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control, pp.1883-1888, vol.53, No 10, October 2006

  72. J. Krupka, J. Breeze, A. Centeno, Neil Mc N. Alford, T. Claussen, and L. Jensen, “Measurements of permittivity, dielectric loss tangent, and resistivity of float zone Silicon at microwave frequencies,” IEEE Trans. on Microwave Theory Tech, vol.54, pp.3995-4001, November 2006

  73. J. Hartnett, M.E. Tobar, J-M Le Floch, P-Y Burgeois, and J. Krupka, “Paramagnetic susceptibility of crystalline ruby at cryogenic temperatures”, Physical Review B, vol.75 (no.2), pp.024415-1 to 024415-6, 2007.

  74. Janusz Parka, Jerzy Krupka, Roman Dąbrowski, Jarek Wosik, "Measurements of anisotropic complex permittivity of liquid crystals at microwave frequencies", Journal of European Ceramic Society, vol.27, pp.2903-2905, 2007

  75. Jerzy Krupka, Krzysztof Derzakowski, Tomasz Zychowicz, Bradley L. Givot, William C. Egbert, M.M. David, "Measurements of the surface resistance and conductivity of thin conductive films at frequency about 1 GHz employing dielectric resonator technique", Journal of European Ceramic Society, vol.27, pp.2823-2826, 2007

  76. Check Ping Yang, P.A. Smith, J. Krupka and T.W. Button, “The losses of microwave ferrites at communication frequencies”, Journal of European Ceramic Society, vol.27, pp.2765-2770, 2007

  77. C.D. Easton, M.V. Jacob and J. Krupka, “Non-destructive complex permittivity measurement of low permittivity thin film materials”, Measurements Scienece and Technology, vol.18. pp.2869-2877, October 2007.

  78. J. Krupka and J. Mazierska, „Contact-less measurements of resistivity of semiconductor wafers employing single-post and split-post dielectric resonator techniques”, IEEE Trans.on IM, pp.1839-1844, October 2007

  79. J. Hartnett, M.E. Tobar and J. Krupka, „Dependence of the dielectric permittivity of single-crystal quartz on thermal deformation at cryogenic temperatures“, Journal of Applied Physics vol.102 2007

  80. J. Breeze, J. Krupka and N. McN Alford, “Enanced quality factors in aperiodic refelector resonators”, Applied Physics Letters, vol.91, 152902, 2007

  81. J.M. Le Floch, M.E. Tobar, D. Mouneyrac, J. Krupka, “Dicsovery of Bragg cofined modes with high Q factor in hollow dielectric resonator”, Applied Physics Letters, vol.91 (14), 142907, 2007

  82. J.M. Le Floch, M.E. Tobar, D. Cros, J. Krupka, “High Q-factor distributed Bragg reflector resonators with reflectors of arbitrary thickness”, IEEE Transactions on UFFC Vol. 54, Issue12, pp. 2689-2695, 2007

  83. J.M. Le Floch, M.E. Tobar, D. Cros, J. Krupka, “Low-loss materials for high Q-factor Bragg reflector resonators”, Applied Physics Letters, vol.92 (3), 032901, Jan.21 2008

  84. J.M.84) J. Krupka, D. Mouneyrac, J. G. Hartnett, and M. E. Tobar, “""Use of Whispering-Gallery Modes and Quasi-TE0np Modes for Broadband Characterization of Bulk Gallium Arsenide and Gallium Phosphide Samples""”, Applied IEEE Transations on Microvawe Theory and Techniques, vol.56, No.5, pp 1201 1206 , 032901, May 2008

  85. J.G. Hartnett, D. Mouneyrac, J.M. Le Floch and J. Krupka, “Modified permittivity observed in bulk gallium arsenide and gallium phosphide samples at 50 K using the whispering gallery mode method”, Applied Physics Letters, Vol.93, Iss.6, 062105, Aug. 11 2008

  86. J. Krupka, "Measurement of the complex permittivity of metal nanoislands and the surface resistance of thin conducting films at microwave frequencies”, Measurements Science and Technology, Vol. 19, Iss. 6 Article Number: 065701. June, 2008

  87. Z.Buczko and J. Krupka, “Effective conductivity measurements of silver coatings employing sapphire dielectric resonator technikque”, Transactions of the Institute of Metal Finishing, vol.86, no,5 pp, 286-288, 2008

  88. J.G. Hartnett, D. Mouneyrac, J.M. Le Floch, J. Krupka, M.E Tobar and D. Cros, “Observation of persistent photoconductivity in bulk gallium arsenide and gallium phosphide samples at cryogenic temperatures using the whispering gallery mode method", JOURNAL OF APPLIED PHYSICS, Volume: 104, Issue: 11, Article Number: 113714, Published: 2008

  89. J. Breeze, J. Krupka, A. Centeno and N. McN Alford, “Temperature stable and high Q-factor TiO2 Bragg reflector resonator”, Applied Physics Letters, Vol.94, 082906 (3 pages) 2009

  90. J. Krupka, and W.Gwarek, “ Measurements and modelling of planar metal film patterns deposited on dielectric substrates”, IEEE Microwave and Wireless Components Letters, vol.19, No.3, pp.134-136, March 2009.

  91. M Popis, J. Krupka, I. Wielgus, and M. Zagórska, “Measurements of microwave conductivity of conjugated polymers and their blends”, Ferroelectrics, Vol.388, Pages: 5-9, 2009

  92. S. Glinsek, B. Malic, Z Kutnjak, H. Wang, J. Krupka and M. Kosec, ”Dielectric properties of KTa0.6Nb0.4O3 thin films on alumina substrates prepared by chemical solution deposition”, Applied Physics Letters, Vol.94, Issue: 17 Article Number: 172905, Published: APR 27 2009

  93. J. Krupka, K. Derzakowski and J. G Hartnett, “Measurements of the complex permittivity and the complex permeability of low and medium loss isotropic and uniaxially anisotropic metamaterials at microwave frequencies”, Measurements Scienece and Technology, Vol. 20, Article Number: 105702 (5pp), 2009.

  94. M.D. Janezic and J. Krupka, “Split-post and split-cylinder resonator techniques: a comparison of complex permittivity measurements”, Journal of Electronics and Electronic Packaging, vol.6, No. 2, pp,97-101, 2009.

  95. K. Racka-Dzietko, E. Tymicki, M. Raczkiewicz, K. Grasza, M. Kozubal, E. Jurkiewicz-Wegner, R. Jakiela, A. Brzozowski, M. Pawłowski, M. Piersa, J. Sadło and J. Krupka, „Characterization of 6H-SIC single crystals by PVT metod using different source materials and open or closed seed backside”, Materials Science Forum, Vol. 615-617, pp.19-22, Trans Tech Publications, Switzerland, 2009

  96. K. Racka-Dzietko, E. Tymicki, K. Grasza, M. Raczkiewicz, R. Jakiela, M. Kozubal, E. Jurkiewicz-Wegner, A. Brzozowski, R. Diduszko, M. Piersa, K. Kościewicz, M. Pawłowski, and J. Krupka, „Characterization of vanadium doped 4H- and 6H-SIC grown by PVT metod using open seed backside”, Materials Science Forum, Vol. 645-648, pp.21-24, Trans Tech Publications, Switzerland, 2010

  97. J. Krupka and W. Strupiński, “Measurements of the sheet resistance and conductivity of thin epitaxial graphene and SiC films”, Applied Physics Letters, Vol.96, (3 pages) 2010

  98. J. Krupka, W. Gwarek, and J. G. Hartnett, "Experimental studies of planar metamaterials with a tunable cylindrical TE01n mode cavity", J. Appl. Phys. 107, 124101 (2010).

  99. S. George, P. S. Anjana, and M. T. Sebastian, J. Krupka, S.Uma and J.Philip, "Dielectric, Mechanical, and Thermal Properties of Low-Permittivity Polymer–Ceramic Composites for Microelectronic Applications", Int. J. Appl. Ceram. Technol., 7 [4] pp. 461 - 474 (2010)

  100. Krupka, W. Gwarek N, Kwietniewski, and J. Hartnett, "Measurements of Planar Metal-Dielectric Structures using Split-Post Dielectric Resonators". IEEE Trans. on MTT vol.6, (2010)

  101. J. Krupka, W. Strupinski, and N. Kwietniewski, "Microwave Conductivity of Very Thin Graphene and Metal Films", Journal of Nanoscience and Nanotechnology, vol.11, No.4, pp.3358-3362, 2011

  102. Krupka, J. G. Hartnett, and M. Piersa, "Permittivity and microwave absorption of semi-insulating InP at microwave frequencies", Applied Physics Letters, vol. 98, 112112, 2011

  103. W. Strupiński, K. Grodecki, A. Wysmolek, R. Stepniewski, T. Szkopek, P.E. Gaskell, A. Gruneis, D. Haberer, R. Bozek, J. Krupka and J.M. Baranowski, „ Graphene epitaxy by chemical vapor deposition on SiC”, Nanoletters, vol.11, pp.1786-1791, 2011

  104. J.M. Le Floch, R. Bara, J.G. Hartnett. M.E. Tobar, D. Mouneyrac , D. Passerieux, D. Cros D, and J. Krupka, P. Goy and S. Caroopen” Electromagnetic properties of polycrystalline diamond from 35 K to room temperature and microwave to terahertz frequencies”, JOURNAL OF APPLIED PHYSICS Volume: 109 Issue: 9 Article Number: 094103 Published: MAY 1 2011

  105. J. G.Hartnett, D. Mouneyrac, J. Krupka, J.M. Le Floch M.E. Tobar, D. Cros,” Microwave properties of semi-insulating silicon carbide between 10 and 40 GHz and at cryogenic temperatures“, JOURNAL OF APPLIED PHYSICS Volume: 109 Issue: 6 Article Number: 064107 Published: MAR 15 2011

  106. J.Krupka, Danh Nguyen, and J. Mazierska, "Microwave and RF Methods of Contact less Mapping of the Sheet Resistance and the Complex Permittivity of Conductive Materials and Semiconductors", Measurements Science and Technology, vol.22, 085703 (6pp), 2011

  107. Krupka, . J. Parka, P. Łoś, J. G. Hartnett and K.Naguszewska, "SILVER-GELATINE METAL-DIELECTRIC COMPOSITES MADE FROM DEVELOPED X-RAY FILMS", IEEE Antennas and Wireless Propagation Letters (2012)

  108. R. Kowerdziej, J. Parka J, Krupka J., “Experimental study of thermally controlled metamaterial containing a liquid crystal layer at microwave frequencies”, LIQUID CRYSTALS, vol. 38, Iss.6, pp. 743-747, 2011

  109. Krupka J.; Shimada T.; Ueda I.; et al. Electromagnetic properties of sapphire, ruby, and irradiated ruby at frequencies of 30-40 GHz, APPLIED PHYSICS LETTERS Volume: 99 Issue: 10, Article Number: 102901 Published: SEP 5 2011

  110. Korpas, Przemyslaw; Usydus, Lukasz; Krupka, Jerzy, Automatic Split Post Dielectric Set-up for Measurements of Substrates and Thin Conducting and Ferroelectric Films, FERROELECTRICS Volume: 434, Pages: 113-120, 2012

    112) Kowerdziej, R.; Krupka, J.; Nowinowski-Kruszelnicki, E.; et al. Microwave complex permittivity of voltage-tunable nematic liquid crystals measured in high resistivity silicon transducers, APPLIED PHYSICS LETTERS, Volume: 102, Issue: 10, Article Number: 102904 , MAR 11 2013

  111. Krupka, J.; Wosik, J.; Jastrzebski, C.; et al., Complex Conductivity of YBCO Films in Normal and Superconducting States Probed by Microwave Measurements, IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, Volume: 23, Issue: 2, Article Number: 1501011, APR 2013

  112. Krupka J., Contactless methods of conductivity and sheet resistance measurement for semiconductors, conductors and superconductors, MEASUREMENT SCIENCE & TECHNOLOGY Volume: 24 Issue: 6 Article Number: 062001, 2013

  113. Racka, K.; Tymicki, E.; Grasza, K.; et al. Growth of SiC by PVT method in the presence of cerium dopant, JOURNAL OF CRYSTAL GROWTH, Volume: 377, Pages: 88-95, 2013


Papers in Polish Jornals


  1. J. Krupka and A.Milewski, "Dokładna metoda pomiaru zespolonej przenikalnoci elektrycznej półprzewodników w cylindrycznym rezonatorze H01n", ArchiwumElektrotechniki, vol.28, pp.523-541, z.3, 1979.

  2. A. Kączkowski, A. Kędzior, J. Krupka, W.Makarewicz and A. Milewski, "Wobuloskopowy miernik dobroci wpaśmieUHF", Elektronika, pp.377-379 , Nr.10, 1976.

  3. J.Krupka and A.Milewski, "Accuratemethod of the measurement of complex permittivity of semiconductors in H01n cylindrical cavity", Electron Technology, vol.11,pp.11-31, No.4, 1978.

  4. J. Krupka and A.Milewski, "Ocena możliwości zastosowania przybliżonych metod analizy do pomiaru zespolonej przenikalności elektrycznej w cylindrycznych rezonatorach H01n" Archiwum Elektrotechniki, vol.28,pp. 548-559,z.3, 1979.

  5. S. Dmowski, J. Krupka iA. Milewski, "Analiza błędów pomiaru rezystywności półprzewodników wcylindrycznych rezonatorach H01n, "Rozprawy Elektrotechniczne, vol.25, pp.503-518, No.2, 1979.

  6. J. Krupka andA. Kędzior,"Optimizationof thecomplex permittivity measurement of low lossdielectrics in a cylindrical TEmode cavities", Electron Technology, vol.14, pp.67-79, No. 1/2, 1981.

  7. A. Harasiewicz i J. Krupka, "Zastosowanie cylindrycznych rezonatorów quasi TE0mn i quasi TM0mn do pomiaru zespolonej przenikalności elektrycznej cylindrycznych próbek dielektryków o dowolnych wymiarach", Rozprawy Elektrotechniczne No 1, 1989.

  8. J. Krupka, S. Dmowski i J. Modelski, "Układ do pomiaru parametrów temperaturowych rezonatorów dielektrycznych w paśmie X", Metrologia i systemy pomiarowe, pp.51-60, PAN, Komitet Metrologii i Aparatury Naukowej, Warszawa 1991.

  9. J. Modelski, S. Dmowski, J. Krupka, K. Derzakowski i J. Skulski, "System pomiarowy do badania własności dielektryków i ferrytów w pasmie mikrofalowym", Prace naukowe Politechniki Warszawskiej, Elektronika z.101, pp.23-39, 1994

  10. J. Krupka, Z. Mączeński andM. Baszun, „Badania konduktywności zespolonej nanowartsw”, Elektronika, pp18-21, ISSN 0033-2089, No 9, 2008


Conference papers

  1. J. Krupka, "Ocenka vozmoznostiej primienienija mietodov aproksymacii w izmierenijach kompleksnoj dielektriceskoj postojannoj w cylindriceskich rezonatorach H01n", Konferencja: Mietody i Sriedstwa Rieszenija Krajevych Zadac, Riga (USRR), 17-19 May 1978

  2. J. Krupka, "Izmerenije kompleksnoj dielektriceskoj pronicajemosti zidkostej s bolsimi poterjami", pp.15-172, Celostatni Konference o Mikrovlnne Technice, Brno (CSRR), 1-3 September 1982

  3. J. Krupka and S. Maj, "Application of TE01 mode dielectric resonator for the complex permittivity measurements of semiconductors", CPEM'86 Conference, National Bureau of Standards, Gaithersburg, Maryland, 23-27 , pp.154-155, June 1986

  4. J. Krupka, "An accurate method of permittivity and loss tangent measurements of low loss dielectrics using TE dielectric resonator" pp.322-325, Fifth International Conference on Dielectric Materials Measurements and Applications, Canterbury, UK, 27-30 June 1988

  5. A. Abramowicz, J. Krupka and Sz. Maj, "Theoretical and experimental study of the resonant modes in shielded dielectric resonators", Mikrowellen und Optoelektronik Kongresmesse fur Hochstfrequenztechnologie, Messehalle Sindelfingen, 28Feb -3 March 1989

  6. J. Krupka, "Opracowanie metody pomiaru zespolonej przenikalności elektrycznej półprzewodników w paśmie mikrofalowym", Sympozjum Naukowe z Okazji 25-rocznicy Powstania Wydziału Elektroniki, Warszawa (Poland), listopad 1976

  7. J. Krupka, "Pomiary konduktywności półprzewodników w funkcji temperatury przy użyciu rezonatora mikrofalowego", I Konferencja Naukowa:Metody Pomiarowe w Materiałoznawstwie Elektronicznym "POMAT '81", Zaborów k. Warszawy (Poland), 14-15 maj, 1981, pp.171-173

  8. A. Harasiewicz i J.Krupka, "Pomiary zespolonej przenikalności elektrycznej i magnetycznej ferrytów", pp.140-142, Sympozjum Naukowe: Miernictwo Mikrofalowe, Warszawa (Poland), 22-23 wrzesień 1987

  9. J. Krupka i A. Tatarynowicz, "Wpływ technologii na mikrofalowe właściwości wybranych materiałów ceramicznych stosowanych w produkcji rezonatorów dielektrycznych", pp.396-401, MIKON '88, Gdańsk (Poland), 3-7 Oct. 1988

  10. J. Krupka, "A new method of measurements of all permeability tensor components of microwave ferrites using one cylindrical ferrite sample", pp.507-511, 20th European Microwave Conference, Budapest, 1990

  11. J. Krupka, W. Glogier i J. Modelski, "Rigorous theory of resonances in waveguide Y-junction circulators", pp.1151-1156, 20-th European Microwave Conference, Budapest, 1990

  12. J. Krupka, S. Dmowski, “Equipment for measurements of electric and magnetic properties of microwave ferrites”, 10th Int. Conf. on Ferrites, pp.479-482, Szczyrk Sept. 24-29, 1990

  13. K. Derzakowski, J. Krupka, and J. Modelski, “Method of measuring the complex permittivity and permeability of ferrite substrates by means of two section dielectric resonator with TE01d mode”, Conference MIKON’91, Rydzyna, pp.87-92, May 28-30, 1991

  14. J. Krupka, D. Cros, P. Guillon and M. Aubourg, "Etude des whispering gallery modes des resonateurs dielectriques isotropes et anisotropes", 8emes Journees Nationales Microondes, Brest 12-14 Mai 1993

  15. J. Modelski, J. Krupka and A. Abramowicz, "Theory and application of circumferentially magnetized ferrites in tunable devices", Proc. 23 European Microwave Conf., pp.581-584, Madrid, September 6-9, 1993

  16. R. Geyer and J. Krupka, "Dielectric properties of materials at cryogenic temperatures and microwave frequencies", Proc. Conf. on Precision Electromagnetic Measurements, pp.350-351, Boulder, Colorado, June 27-July 1, 1994

  17. R. Geyer and J. Krupka, "Use of parallel-plate dielectric resonator for material measurements", Int. Union of Radio Science (URSI) Conf. Digest, p.225, Boulder, Colorado, January 5-8, 1994

  18. R. Geyer, J. Krupka and J. Baker-Jarvis "Dynamic resonator measurements of metallic surface resistance and complex permittivity", IEEE Antenna Propagation Society/URSI International Conf. Procceedings, Seattle, Washington June 19-24, 1994

  19. J. Modelski, K. Derzakowski, J. Krupka, "Microwave system for measurements of material properties", XIII IMEKO World Congress, pp. 535-540, Torino, September 5-9, 1994

  20. J. Ceremuga, J. Krupka, and J. Modelski, "Influence of film thickness on the resonant frequencies and Q-factors of the sapphire dielectric resonator and on resulting surface impedance of high Tc superconductors", pp. 1069-1072, Proc.of Asia Pacific Microwave Conference, Tokyo, Japan December 6-9, 1994

  21. J. Krupka, J. Modelski, and A. Abramowicz, "Tunable devices employing circumferentially magnetized ferrites", X Int. Conference MIKON '94, Książ, Poland, pp.53-57, May 30 - June 2, 1994

  22. M. Kock, F. Henze, A. Abramowicz, J. Krupkaand J.Hinken, "Realization of a bandpass filter with dielectric quarter-cut resonator", X Int.Conference MIKON '94 , Książ, Poland, pp.97-100, May 30 - June 2, 1994

  23. J. Krupka, "Electromagnetic field modeling for microwave materials measurements application", X Int. Conference MIKON '94 , Książ, Poland, pp.642-644, May 30 - June 2, 1994

  24. J. Krupka, S. Dmowski, R. Geyer and M. Kuhn, "Dokładny pomiar rezystancji powierzchniowej nadprzewodników wysokotemperaturowych przy użyciu dielektrycznych rezonatorów wykonanych z szafiru",V Konferencja ELTE'94,pp.203-206, Szczyrk, April 20-23, 1994

  25. J. Krupka, R. Geyer,and D. Cros, "Use of higher order TE0mn modes in dielectric measurements of dielectric rod resonators", X Int. Conference MIKON '94, Książ, Poland, pp.567-572, May 30 - June 2, 1994

  26. R.G. Geyer, J. Krupka, "Variable-temperature microwave dielectric properties of isotropic and anisotropic materials", 1995 IEEE AP-S Int. Symposium and URSI Radio Science Meeting, Newport Beach, California, June 18-23, 1995

  27. K. Derzakowski, A. Abramowicz , and J. Krupka, "Application of the dielectric resonator to measurements of dielectric, ferrite and superconductor substrates", ICEAA Conference, Torino, Italy, pp.375-378, September, 1995

  28. J. Krupka, S. Pietruszko, R. Geyer, J. Baker-Jarvis, and K. Derzakowski, "Semiconductors resistivity measurements using split dielectric resonator technique", Conference MIKON '96 , Warsaw, Poland, pp.361-364, May 27 - 30, 1996

  29. J. Krupka, D. Cros, A. Luiten, and M. Tobar, "Design of very high Q sapphire resonators", Conference MIKON '96, Warsaw, Poland, pp.13-16, May 27 - 30, 1996

  30. K. Kucharski and J. Krupka, "Mode-matching method for determination of the complex permittivity in reentrant cavity", Conference MIKON '96 , Warsaw, Poland, pp.40-44, May 27 - 30, 1996

  31. J. Ceremuga, J. Krupka, "Dielectric resonators for microwave characterization of high temperature superconductors", SPIE Conference Proc. vol. 2697, "Oxide Superconductor and Nano Engineering II", San Jose, January 30-February 2, 1996

  32. J. Krupka, R.G. Geyer, J. Baker-Jarvis, and J. Ceremuga, "Measurements of the complex permittivity of microwave circuit board substrates using split dielectric resonator and reentrant cavity techniques", pp.21-24,DMMA'96 Conference, Bath, U.K. 23-26 Sept. 1996

  33. R. Geyer, J. Krupka, L. Sengupta, and S. Sengupta, "Microwave properties of composite ceramic phase shifter materials", Proc. of ISAF, 1996

  34. J. Ceremuga and J. Krupka, "Dielectric resonators for microwave characterization of high temperature superconductors", Proc. SPIE-The International Society for Optical Engineering, vol. 2697, pp. 77-86, San Jose, 30 Jan.-2 Feb., 1996

  35. M.E. Tobar, J. Krupka, E.N. Ivanov, R.A. Woode, "Dielectric frequency compensation of high quality sapphire dielectric resonators", IEEE Frequency Control Symposium, pp.799-781, 1996

  36. R.G. Geyer and J. Krupka, "Microwave behavior of ferrites: theory and experiment", CPEM'96, Germany, 1996

  37. J. Krupka , K. Derzakowski, A. Abramowicz, J. Ceremuga and R.G. Geyer, "Application of mode matching technique for modeling of cylindrical dielectric resonators containing multilateral superconducting, metal and dielectric media", NUMELEC'97 Conference, Lyon, France, March 19-21, 1997

  38. J. Krupka, K. Derzakowski, A. Abramowicz, M. Tobar and R. G. Geyer, "Measurements of the complex permittivity of extremaly low loss dielectric materials using whispering gallery modes", IEEE MTT-Symposium, Denver, June 8-14, pp.1347-1350, 1997

  39. K. Leong, J. Mazierska, and J. Krupka, "Measurements of unloaded Q-factor of transmission mode dielectric resonators", IEEE MTT-Symposium, Denver June 8-14, pp.1639-1646, 1997

  40. J. Krupka, P. Blondy, D. Cros and P. Guillon, "Whispering gallery mode measurements in tunable ferrite resonators", Workshop WMI, IEEE MTT-Symposium, Denver June 8-13, pp.1-6, 1997

  41. J. Krupka, R.Geyer and C. Weil, "Accuracy of the dielectric resonator technique for measuring the microwave surface impedance of superconductors", p.836, PIERS'97, Cambridge, 7-11 July 1997

  42. K. Derzakowski and J. Krupka, "Complex resonant frequencies of multilayered uniaxially anisotropic dielectric resonators", p.271, PIERS'97, Cambridge, 7-11 July 1997

  43. M.E. Tobar, J. Krupka, E.N. Ivanov, R.A. Woode, "Sapphire-rutile frequency-temperature compensated whispering gallery mode resonators", Proc of. IEEE Frequency Control Symposium, pp.1000-1003, 1997

  44. R.G. Geyer, J. Krupka, and C. Jones, "Complex permeability measurements of ferrite ceramics used in wireless communications", Proc. of Int. Symp. on Dielectric Ceramics: Processing, Properties and Applications, American Ceramic Society, pp.93-113,1997

  45. R.G. Geyer, J. Krupka, and C. Jones, "Microwave characterization of dielectric ceramics for wireless communications", Proc. of Int. Symp. on Dielectric Ceramics: Processing, Properties and Applications, American Ceramic Society, pp.79-91,1997

  46. A.Abramowicz, K. Derzakowski, and J. Krupka, "New formulation for external coupling analysis and measurements", ICEAA Conference, Torino, Italy, pp.247-250, September 15-18, 1997

  47. J. Krupka and C. Weil, "Recent advances in metrology for the electromagnetic characterization of materials at microwave frequencies”, Conference MIKON '98 , Cracow, Poland, pp.243-253, May 20- 22, 1998

  48. J. Krupka, K. Derzakowski and A. Abramowicz, "Computations of 3D electromagnetic fields distributions in axially symmetric multilateral dielectric resonators by means of Galerkin-Rayleigh-Ritz method”, Conference MIKON '98 , Cracow, Poland, pp.491-495, May 20 - 22, 1998

  49. J. Krupka, J. Rogowski, J. Baker-Jarvis and R. Geyer, "Scalar permeability measurements of microwave ferrites using lumped circuit, coaxial line and resonance techniques”, Conference MIKON '98 , Cracow, Poland, pp.701-704, May 20 - 22, 1998

  50. M.E. Tobar, J. Hartnett, A. Mann, E. Ivanov and J. Krupka, "New frequency-time compensation techniques for high-Q sapphire resonators”, 12th European Frequency and Time Forum, March 10-12, 1998

  51. J. Krupka, K. Derzakowski, M. Tobar and R.Geyer "Dielectric properties of extremely low loss single crystal dielectrics at cryogenic temperatures”, p.1131, PIERS'98, Nantes, 13-17 July 1998

  52. M. Tobar, J. Hartnett, J. Krupka, A. Mann, E. Ivanov and R.Geyer "Measurements of doped and composite low loss single crystal dielectric resonators for secondary frequency standards”, p. 1134, PIERS'98, Nantes, 13-17 July 1998

  53. R. Geyer, J. Krupka and M. Tobar, "Microwave dielectric properties of low-loss materials at low temperature”, Symposium: Microwave Processing of Materials V (O), 1998

  54. K. Derzakowski, J. Krupka, J. Modelski, A. Abramowicz, “Investigation of whispering gallery modes by means of the mode matching method”, pp. 315-318, Microcoll, Budapest, March 21-24, 1999

  55. J. Krupka, M. Tobar, R. Geyer, and C. Weil, “Measurement techniques of extremely low loss dielectrics at microwave frequencies”, The Dielectric Society 30th Annual Conference, Canterbury, 12-14 April, 1999

  56. C. Weil, J. Baker-Jarvis, B. Riddle, M. Janezic, and J. Krupka, “Measurement issues involving accurate RF characterization of printed wiring boards”, The Dielectric Society 30th Annual Conference, Canterbury, 12-14 April, 1999

  57. J. Krupka, A. Abramowicz and, K. Derzakowski, “Design and realization of the high-Q triple dielectric resonator filters with wide tuning range”, 29-th European microwave Conference, pp.103-106, Munich, October 4-8, 1999

  58. J. Krupka, A. P. Gregory, O. C. Rochard, and R. N. Clarke, ”Le split resoantor et d’aautres techniques de mesures”, Int. Conf. 6-emes Journees de Characterisation Mico-ondes et Materiaux (JCMM’2000), pp.101-104, Paris 22-24 Mars, 2000

  59. J. Krupka, A P Gregory, O C Rochard, R N Clarke, B Riddle and J Baker-Jarvis, “Uncertainty of Complex Permittivity Measurements by Split-Post Dielectric Resonator Technique”, International Conference on Microwave Materials and Their Applications – MMA2000, Bled, Slovenia, p.57, Oral presentation 20 minutes, Aug. 30 – Sep. 2, 2000

  60. A.G. Mann, and J. Krupka “Measurements of susceptibility due to paramagnetic impurities in sapphire using whispering gallery modes”, XIII Int. Conference MIKON’2000 , Wrocław, Poland, pp.421-424, May 22 - 24, 2000

  61. J. Krupka, K. Derzakowski, G. Annino, M. Cassettari, I. Longo, and M. Martinelli, ”Whispering gallery modes in rutile resonators at millimeter wave frequencies”, XIII Int. Conference MIKON’2000, Wrocław, Poland, pp.41-44, May 22 - 24, 2000

  62. J. Mazierska and J. Krupka, “Dielectric resonators for low temperature electronics applications”, XIII Int. Conference MIKON’2000, Wrocław, Poland, pp.45-48, May 22 - 24, 2000

  63. J. Krupka, J. Baker-Jarvis, and R. G. Geyer, “Complex permittivity measurements of single-crystal and ceramic strontium titanate at microwave frequencies and cryogenic temperatures”, XIII Int. Conference MIKON’2000, Wrocław, Poland, pp.301-304, May 22 - 24, 2000

  64. B. L. Givot, J. Krupka, D. Y. Belete, “Split post dielectric resonator technique for dielectric cure monitoring of structural adhesives”, XIII Int. Conference MIKON’2000, Wrocław, Poland, pp.309-312, May 22 - 24, 2000

  65. J. Krupka, R. N. Clarke O. C. Rochard, and A. P. Gregory, “Split Post Dielectric Resonator technique for precise measurements of laminar dielectric specimens – measurement uncertainities”, XIII Int. Conference MIKON’2000, Wrocław, Poland, pp.305-308, May 22 - 24, 2000

  66. K. Derzakowski, A. Abramowicz,.and J. Krupka, , “Whispering gallery resonator method for permittivity measurements”, XIII Int. Conference MIKON’2000, Wrocław, Poland, pp.425-428, May 22 - 24, 2000

  67. J. Krupka, A. Abramowicz, K. Derzakowski, “Tunable dielectric resonator bandpass filter”, XIII Int. Conference MIKON’2000, Wrocław, Poland, pp.517-520, May 22 - 24, 2000

  68. J. Krupka, “Measurements of the complex permittivity and complex permeability of ferrite materials at microwave frequencies”, XV International Conference on Microwave Ferrites, pp.83-84, Rokosowo, Poland, Invited paper – 40 minutes oral presentation, September 4-7, 2000

  69. J. Krupka, “Precise measurements of the complex permittivity of bulk and tape dielectric materials at microwave frequencies”, 90 minute talk 106 slides on CD, Special Section for Microwave Materials Workshop, APMC’2001, Taipei, Taiwan, Dec 3-6, 2001

  70. J. Krupka, “Precise measurements of the complex permittivity of dielectric materials at microwave frequencies”, PMC’2001, Taipei, Taiwan, Dec 3-6, 2001

  71. M. V. Jacob, J. Mazierska, K. Leong, and J. Krupka, „Novel Method for Calculation and Measurement of Unloaded Q-Factor of Superconducting Dielectric Resonators”, IEEE-MTT-Symposium, Phoenix, Arizona, May 20-25, 2001

  72. M. D. Janezic, J. Krupka, and J. Baker-Jarvis, “ Non-destructive permittivity measurements of dielectric substrates using split-cylinder and split-post resonators”, International Conference on Advances in Processing, Testing and Application of Dielectric Materials, Wrocław APTADM’2001, September 17-19, pp.116-118, 2001

  73. J. Krupka, “Split Post Dielectric Resonators for Measurements of the Complex Permittivity of Laminar Dielectric Materials at Microwave Frequencies”, 4 page extended abstract on CD Conference Proceedings, Workshop on the Applications of Radio Science WARS’2002, Leura, Blue Mountains, NSW, Australia, February 20-22, 2002

  74. J. G. Hartnett, ,A. N. Luiten, J. Krupka, M. E. Tobar, P. Bilski, “Microwave Properties of Ultra-Low Loss Chromium-Doped YAG”, 6 page paper on CD Conference Proceedings, Workshop on the Applications of Radio Science WARS’2002, Leura, Blue Mountains, NSW, Australia, February 20-22, 2002

  75. J. Krupka and M. Janezic, “Non-destructive permittivity measurements of low-loss substrates”, Contribution (26 slides) published on CD, IMAPS, Advanced Technology Workshop on Ceramic Applications for Microwave and Photonic Packaging, Providence, Rhode Island, May 2-3, 2002

  76. J. Krupka, “Dielectric Measurements on Low-Loss Materials”, Contribution (3 pages summary) published on CD (Commission A), Invited paper XXVII General Assembly of the International Union of Radio Science. Maastricht 17-24 August, 2002

  77. J. Krupka „Developments in techniques to measure dielectric properties of low-loss materials at frequencies 1-50 GHz”, (1 page summary), Invited paper at MMA’2002, York , August 31-September 1, 2002

  78. M. V. Jacob, J. Mazierska, D. Ledneyov, and J. Krupka „Microwave characterization of CaF2 at cryogenic temperatures using dielectric resonator technique”, (1 page summary), MMA’2002, York, August 31-September 1, 2002

  79. J. Mazierska, M. Jacob, A. Harring and J. Krupka „Measurements of loss tangent and relative permittivity of LTCC ceramics at varying temperatures and frequencies”, (1 page summary), MMA’2002, York , August 31-September 1, 2002

  80. K. Derzakowski, A. Abramowicz and J. Krupka, “Accuracy of the permittivity measurements using open dielectric resonators”, X National Symposium of Radio Science, pp. 341-344, Poznań, March 14-15, 2002

  81. J. Krupka, A. Abramowicz and K. Derzakowski “Precise measurements of the complex permittivity at microwave frequencies”, X National Symposium of Radio Science, pp. 345-353, Poznań, March 14-15, 2002

  82. J. Krupka, K. Derzakowski, A. Abramowicz J. Baker-Jarvis, R. Ono, R. Geyer, “Surface impedance measurements of thin high temperature superconducting films with a sapphire dielectric resonator”, XIV Int. Conference MIKON’2002, Gdańsk, Poland, pp.391-393, May 22 - 24, 2002

  83. J. Krupka, K. Derzakowski, A. Abramowicz, B. Ridle, J. Baker-Jarvis, R. N. Clarke and O.C. Rochard, “Bounds on permittivity calculations using the TE01 Dielectric Resonator”, XII Int. Conference MIKON’2002, Gdańsk, Poland, pp.394-396, May 22 - 24, 2002

  84. B L Givot, J Krupka and K. Derzakowski, “Split-Post Dielectric Resonator for Complex Permittivity Measurements at 20-25 GHz”, XIV Int. Conference MIKON’2002, Gdańsk, Poland, pp.401-403, May 22 - 24, 2002

  85. J. Krupka and T. Zychowicz, “Measurements of the complex permittivity of wood at microwave frequencies”, p.46, The physics Congress, Edinburgh, 23-27 March, 2003

  86. J. Krupka, A. Abramowicz and K. Derzakowski, „Magnetically tunable dielectric resonators operating at frequencies about 2 GHz”, p.31, The physics Congress, Edinburgh, 23-27 March, 2003

  87. J. Krupka and J. Mazierska, “Recent advances in measurements of permittivity and dielectric losses at microwave frequencies”, Books of Abstracts p.137, ISMOT 2003, Ostrava, Czech Republic, August 11-15 2003

  88. A.Abramowicz, J. Krupka, and K. Derzakowski, “Triplet dielectric resonator filters with direct coupling”, Proc. Of the International Conference on Electromagnetics in Advanced Applications, pp.143-146, Torino, Italy, September 8-12,2003

  89. A. Fowler, J.Hartnett, M. Tobar, and J.Krupka, “The microwave characterization of single crystal fluorides at microwave frequencies and cryogenic temperatures”, Proceedings of the 2003 IEEE International Frequency Control Symposium and PDA Exhibition, Jointly with the 17th European Frequency and Time Forum, pp.391-394, 2003

  90. J. Krupka, K. Derzakowski, M.D. Janezic, and J. Baker-Jarvis, „TE01 dielectric resonator technique for precise measurements of the complex permittivity of lossy liquids at frequencies below 1 GHz”, Conference on Precision Electromagnetic Measurements Digest, pp.469-470, London, 27 June- 2 July, 2004

  91. Mazierska, J. Krupka, M.V. Jacob, and D. Ledenyov, “Complex permittivity measurements at variable temperatures of low loss dielectric substrates employing split post and single post dielectric resonators”, IEEE MTT Symposium Digest, pp.1825-1828, Fort-Worth, 2004

  92. J. Mazierska, M. Jacob, J. Krupka, Precise Characterization of Materials for Emerging Technologies”, Invited Paper, Proceedings of Asia Pacific Microwave Conference APMC2004, 15-18 December 2004, IEEE Press, 2004

  93. J. Krupka, “Complex permittivity measurements with split post dielectric resonator”, International Microwave Symposium Workshop: Measurement Methods for the Broadband Characterization of Dielectric Substrates, 27 slides, Fort-Worth, June 7, 2004

  94. B.L. Givot and J. Krupka, “ 700 MHz split post dielectric resonator for measurements of the complex permittivity of fluoropolymer materials”, Digest of Int. Conference on Microwaves Radar ad Wireless Communications: MIKON’2004, pp.671-673, Warszawa, May 17-19, 2004

  95. K. Derzakowski, J. Krupka and A. Abramowicz, ”Tunable dielectric resonator with circumferentially magnetized ferrite disks”, Digest of Int. Conference on Microwaves Radar ad Wireless Communications: MIKON’2004, pp.1052-1055, Warszawa, May 17-19, 2004

  96. B. Dziurdzia, J. Krupka, and W. Grzegorczyk, “Measurements of RF dielectric properties of thick-film materials with split-post resonator”, XXVIII International Conference of IMAPS Poland Chapter, pp.205-210, Wroclaw, September 26-29, 2004

  97. J. Krupka, “Measurements of low loss dielectric materials at millimeter wave frequencies”, invited talk at International Conference on Microwave Materials and their Applications, MMA’2004,Inuyama, Japan, October 25-28, 2004, abstract on page 63 in MMA’2004 proceedings

  98. R. G. Geyer, P. Kabos, J. Baker-Jarvis and J. Krupka, “Variable-temperature microwave dielectric properties characterization of ferroelectric materials using dielectric sleeve resonators”, International Conference on Microwave Materials and their Applications, MMA’2004,Inuyama, Japan, October 25-28, 2004, abstract on page 100 in MMA’2004 proceedings

  99. T. Zychowicz, J. Krupka, and M.E. Tobar, “Whispering gallery modes in hollow spherical dielectric resonators”, International Conference on Microwave Materials and their Applications, MMA’2004,Inuyama, Japan, October 25-28, 2004, abstract on page 205 in MMA’2004 proceedings

  100. M.V. Jacob, J. Mazierska, J. Krupka and S. Takeuchi, “Dielectric properties of yttrium vanadate crystals from 15 K – 295 K”, International Conference on Microwave Materials and their Applications, MMA’2004,Inuyama, Japan, October 25-28, 2004, extended abstract, pp.1-3, in MMA’2004 proceedings

  101. M.V. Jacob, J. Mazierska, S. Takeuchi, and J. Krupka, “Microwave characterization of Ba(Sn,Mg,Ta)O3 based transparent substrate material at cryogenic temperatures”, International Conference on Microwave Materials and their Applications, MMA’2004,Inuyama, Japan, October 25-28, 2004, extended abstract, pp.4-7, in MMA’2004 proceedings

  102. Wei-Te Huang, Mean-Jue Tung and J. Krupka, “Multi-frequency measurements of low-loss dielectric materials employing higher order TE0np modes and different cavities”, International Conference on Microwave Materials and their Applications, MMA’2004,Inuyama, Japan, October 25-28, 2004, extended abstract, pp.22-25, in MMA’2004 proceedings

  103. R.G. Geyer, J. Baker-Jarvis and J.Krupka, "Dielectric characterization of single-crystal LiF, CaF2, MgF2, BaF2, and SrF2 at microwave frequencies", pp.493-497, Annual Report, Conference on Electrical Insulation and Dielectric Phenomena, October 17-20, 2004 Boulder, Colorado, USA

  104. K. Derzakowski, J. Krupka and A. Abramowicz, “Magnetically tunable dielectric resonators and filters”, Proc. of 34th European Microwave Conference, pp.1121-1124, Amsterdam 12-14 October, 2004

  105. J. Krupka, Wei-Te Huang and Mean-Jue Tung, „Complex Permittivity Measurements of Thin Ferroelectric Films Employing Split Post Dielectric Resonator“, Presentation 06-021, IMF11, September 5-9, Iguacu, Brazil, 2004

  106. Jean-Michel Guy Le Floch, Michael Edmund Tobar, Jerzy Krupka, Dominique Cros. “Design Methods For High-Q Factor Dielectric Bragg Reflector Resonators”, APMC’2005, December 4-7, 2005, ISBN:0-7803-9434-8, Suzhou, China, 2005

  107. Janina E Mazierska, Mohan V Jacob, Dimitri Ledenyov, Jerzy Krupka “Loss Tangent Measurements of Dielectric Substrates From 15K To 300K With Two Resonators: Investigations into Accuracy Issues”, APMC’2005, December 4-7, 2005, ISBN:0-7803-9434-8, pp.2370-2373, Suzhou, China, 2005

  108. Mohan V Jacob, Janina Mazierska, Jerzy Krupka “Low Temperature Complex Permittivity of MgF2 At Microwave Frequencies”, APMC’2005, December 4-7, 2005, ISBN:0-7803-9434-8, pp.3455-3458, Suzhou, China, 2005

  109. Mohan V Jacob, Janina Mazierska and Jerzy Krupka, “Microwave Characterization of Calcium Fluoride in the Temperature Range 15-300K”, Proc. of 29th International Conference on Advanced Ceramics and Composites, American Ceramic Society, ISBN: 1-57498-249-4, vol. 26, Issues 2-8, pp. 161-168, 2005

  110. M. V. Jacob, J. Mazierska and J. Krupka: “Low Temperature Complex Permittivity of MgF2 at Microwave Frequencies from TE01d modes”, Proceedings of Asia Pacific Microwave Conference APMC2005, Suzhou, China, 4-7 December 2005, IEEE Press, ISBN:0-7803-9434-8, pp.3455-3458, 2005

  111. J. Mazierska, J. Krupka, M. V. Jacob: “Precise Microwave Characterization of Low Loss Dielectrics”, Invited Paper, Microwave Workshop Digest, MWE2005, Proceedings of Microwave Workshops and Exhibition 2005, Yokohama, 9-11 November 2005, IEICE Press, pp. 295-300, 2005

  112. Barbara Dziurdzia, Jerzy Krupka, Wojciech Gregorczyk, “Characterization of Photoimageable Thick-Film Fodel Dielectric at Microwave Frequencies”, Proc. MIKON’2006, vol.1, pp.361-364, May 22-26, 2006

  113. Bradley Givot, Jerzy Krupka, Kevin Lees, Robert Clarke, Graham Hill, “Accurate measurements of permittivity and dielectric loss tangent of low loss dielectrics at frequency range 100 MHz – 20 GHz”, Proc. MIKON’2006, vol.1, pp.232-236, May 22-26, 2006

  114. James Baker-Jarvis, Michael D. Janezic, and Jerzy Krupka, “Measurements of Coaxial Dielectric Samples Employing Both Transmission/Reflection and Resonant Techniques to Enhance Air-Gap Corrections”, Proc. MIKON’2006, vol.3, pp.1093-1096, May 22-26, 2006

  115. Jerzy Krupka, Jonathan Breeze, Neil Mc N. Alford, Anthony E. Centeno, Leif Jensen and Thomas Claussen, “Measurements of Permittivity and Dielectric Loss Tangent of High Resistivity Float Zone Silicon at Microwave Frequencies”, Proc. MIKON’2006, vol.3, pp.1097-1100, May 22-26, 2006

  116. Mohan Jacob, Jerzy Krupka, Krzysztof Derzakowski and Janina Mazierska, “Measurements of Thin Polymer Films Employing Split Post Dielectric Resonator Technique”, Proc. MIKON’2006, vol.1, pp.229-231, May 22-26, 2006

  117. J.Mazierska, J.Krupka, M Bialkowski and M.V.Jacob, “Microwave resonators and their use as measurement instruments and sensors”, 3rd International Workshop on Electronic Design, Test and Applications, 2006

  118. A.Abramowicz, K. Derzakowski and J. Krupka, „Optimization of spurious response In dielectric rezonator tunable filters”, Proc. MIKON’2006, pp.338-341, May 22-26, 2006

  119. Jerzy Krupka, Krzysztof Derzakowski, Tomasz Zychowicz, Bradley L. Givot, William C. Egbert and M.M.David, “Measurements of the surface resistance and conductivity of thin conductive films at frequencies near 1 GHz employing the dielectric resonator technique”, MMA’2006 Book of Abstracts, p.54, Oulu, June 1-15, 2006

  120. Janusz Parka, Jerzy Krupka, Roman Dąbrowski, Jarek Wosik, “Measurements of Anisotropic Complex Permittivity of Liquid Crystals at Microwave Frequencies”, MMA’2006 Book of Abstracts, p.73, Oulu, June 1-15, 2006

  121. Sergiy Veljko, Viktor Bovtun, Jerzy Krupka, Stanislav Kamba, “Microwave dielectric properties of bulk ferroelectric materials measured by composite dielectric resonator, MMA’2006 Book of Abstracts, p.161

  122. M.E. Tobar, J.M. Le Floch, D. Cros and J. Krupka, “General design technique for high Q-factor Bragg reflector resonators”, MMA’2006 Book of Abstracts, p.23, Oulu, June 1-15, 2006

  123. Chen Y. Yang, Paul A. Smith, Jerzy Krupka and Thimothy Button, “ The loss of microwave ferrite materials at communication frequencies”, MMA’2006 Book of Abstracts, p.29. Oulu, June 1-15, 2006

  124. J. Mazierska J. Krupka, M. Bialkowski and M. V. Jacob, “Microwave Resonators and Their Use as Measurement Instruments and Sensors”, Proc. of the Third IEEE Int. Workshop on Electronic Design, Test and Applications (DELTA’06)

  125. T. Zychowicz, J. Krupka and J. Mazierska: “Measurements of Conductivity of Thin Gold Films at Microwave Frequencies Employing Resonant Techniques”, Proceedings of Asia Pacific Microwave Conference, Yokohama, 14-17 December 2006 vol. 1, paper WEOF-57, ISBN 4-902339-08-0, pp. 572-574, 2006

  126. M.V. Jacob, J. Krupka and J. Mazierska and M. Białkowski: “Temperature dependence of complex permittivity of planar microwave materials”, Proceedings of Asia Pacific Microwave Conference, Yokohama, 14-17 December 2006 vol. 1, paper FR1C-2, ISBN 4-902339-08-0, pp. 1453-1456, 2006

  127. A. Centeno, J.D.Breeze, J.Krupka, R.A.Walters, K.Sarma, H Chien, R.C.Pullar, P.K.Petrov and N.McN Alford, “Evaluating the properties of dielectric materials for microwave integrated circuits”, IET Seminar on “Challenges in Modelling and Measurement of Electromagnetic Materials”, London, October 2006.

  128. M.V. Jacob, G. Suboth, M.T. Sebastian, J. Krupka and J. Mazierska and M. Białkowski: “Microwave Characterisation of MgTe2O5 using quasi TE0np Mode Dielectric Resonator Technique”, Proceedings of Asia Pacific Microwave Conference, Bangkok, 11-14 December 2007 vol. 3, paper FR-A2-G2, ISBN 1-4244-0748-6, pp. 1481-1483, 2007

  129. J. Krupka, J. Mazierska, Y. Kobayashi, S. Ganchev, „Resonant tchniques for the complex permittivity and conductivity measurements of materials at microwave frequencies”. Tutorials, Session 3P, Asia Pacific Microwave Conference, Bangkok, 11-14 December 2007

  130. B.L Givot, J. Krupka, K. Derzakowski, “Measurements of Powders and Liqiuds Employing Dielectric Resonator Technique”, Proc. MIKON’2008, May 19-23, 2008

  131. A. Stefański and J. Krupka, “Complex Permittivity Measuremnts of Lossy Liqiuds at Microwave Frequencies”, Proc. MIKON’2008, May 19-23, 2008

  132. J. Krupka, K. Derzakowski, M. Jacob and B.L Givot, “Measurements of Thin Resistive Films Employing Split Post Dielectric Resonator Technique”, Proc. MIKON’2008, May 19-23, 2008

  133. A.Centeno, J.D.Breeze, N.McN.Alford and J.Krupka, “Measurement of High LossDielectric Materials Using a Resonant Technique”, European Time and Frequency Forum, Toulouse Space Week, April 2008.

  134. B. Malic, J. Krupka, M. Zhang, H. Wang, J. Cilensek and M. Kosec, “Dielectric properties of (Ba,Sr)TiO3 thin films at microwave frequencies by split post dielectric resonator technique”, MMA’2008 Conference. Hangzhou, Nov. 1-4, 2008, p.72

  135. J. Krupka, “Measurements of lossy dielectric materials and artificial dielectrics at microwave frequencies”, MMA’2008 Conference. Hangzhou, Nov. 1-4, 2008, p.59

  136. J. Krupka, M. Popis, I. Wielgus and M. Zagórska, „Measurements of microwave conductivity of conjugated polymers and their blends”, MMA’2008 Conference. Hangzhou, Nov. 1-4, 2008, p. 114

  137. J. Wosik, C. Darne, Lei-Ming Xie, W. Zagozdzon-Wosik, J. Krupka and K. Schmidt, „Measureemnts and modeling of the complex permittivity of single-walled carbon nanotubes fiber at microwave frequencies”, MMA’2008 Conference. Hangzhou, Nov. 1-4, 2008. p.116

  138. S. George, P.S. Aniana, J. Krupka and M.T. Sebastian, “Microwave dielectric properties of polystyrene/Li2MgSiO4 composites for microwave applications”, MMA’2008 Conference. Hangzhou, Nov. 1-4, 2008. p.123

  139. K. Grasza, K. Racka-Dzietko, E. Tymicki, M. Raczkiewicz, P. Kamiński, R. Diduszko, A. Brzozowski, E. Jurkiewicz-Wegner, R. Jakiela, M. Kozuba A. Bajor and J. Krupka „Opracowanie technologii monokrystalizacji SiC- charakteryzacja kryształów otrzymanych w pierwszym etapie realizacji projektu” VII Krajowa Konferencja Elektroniki, Darlówko Wschodnie 02-04 June, 2008

  140. K. Racka-Dzietko, E. Tymicki, M. Raczkiewicz, K. Grasza1, E. Jurkiewicz-Wegner, R. Jakieła, A. Brzozowski, M. Kozubal, and J. Krupka, "Characterization of 6H-SiC single crystals grown by PVT metod using different source materials and open or closed seed backside", 7th European Conference on Silikon Carbide and Related Materiale, Barcelona, Spain, September 7-11, 2008.

  141. Jerzy Krupka, “Measurements of Materials at Microwave Frequencies”, Invited Paper, Conference MIDEM’2009, Postojna September 9-11, Slovenia, 2009

  142. Jerzy Krupka, “Measurements of Electromagnetic Properties of Materials at Microwave Frequencies”, Invited Paper, International Conference on Advancd Functional Materials, ICFAM’2009, Trivandrum December 9-10, India.

  143. K. Racka-Dzietko, E. Tymicki, M. Raczkiewicz, K. Grasza, M. Kozubal, E. Jurkiewicz-Wegner, R. Jakiela, A. Brzozowski, M. Pawłowski, M. Piersa, J. Sadło and J. Krupka, „Characterization of 6H-SIC single crystals by PVT metod using different source materials and open or closed seed backside”, Materials Science Forum, Vol. 615-617, pp.19-22, Trans Tech Publications, Switzerland, 2009

  144. K. Racka-Dzietko, E. Tymicki, K. Grasza, M. Raczkiewicz, R. Jakiela, M. Kozubal, E. Jurkiewicz-Wegner, A. Brzozowski, R. Diduszko, M. Piersa, K. Kościewicz, M. Pawłowski, and J. Krupka, „Characterization of vanadium doped 4H- and 6H-SIC grown by PVT metod using open seed backside”, Materials Science Forum, Vol. 645-648, pp.21-24, Trans Tech Publications, Switzerland, 2010

  145. K. Derzakowski and J. Krupka, "Measurements of the complex permeability of yttrium iron garnet substrates near ferromagnetic resonance", Conf. Proc. MIKON 2010, Vilnius, 14-18 June 2010

  146. J. G. Hartnett, J. Krupka, and N. Kwietniewski, "Dielectric and Magnetic Properties of Metamaterials at Microwave Frequencies", MMA2010, Warsaw September 1-3, 2010

  147. M. Valant, G. S. Babu,.A. Axelsson, T. Kolodiazhnyi, J. Krupka, "New Generation of Functional Pyrochlores – Magnetic Semiconductor Pyrochlores", MMA2010, Warsaw September 1-3, 2010

  148. Z. Buczko, J. Krupka, W. Okurowski, A. Przywóski, J. Jakubiak, „Microwave properties of electrolytic metal coatings”, MMA2010, Warsaw September 1-3, 2010

  149. A. Blew, D. Nguyen, J. Krupka, and Janina Mazierska, "Microwave and RF Methods of Contact-less Mapping of the Sheet Resistance and the Complex Permittivity of Conductive Materials", MMA2010, Warsaw September 1-3, 2010

  150. M. Jakubowska, A. Mlożniak, J. Krupka, "Dielectric and magnetic properties of PMMA/Al thick films at microwave frequencies", MMA2010, Warsaw September 1-3, 2010

  151. J. Kowerdziej, J. Parka, J. Krupka, "Negative-Zero-Positive Metamaterials with Liquid Crystals at Microwave Frequencies", MMA2010, Warsaw September 1-3, 2010

  152. J. Parka, J. Krupka, K. Czupryński, "Liquid Crystal Anisotropy Properties in GHz Wave Range and Possibility of Their Application", MMA2010, Warsaw September 1-3, 2010

  153. Hong Wang, Feng Xiang, Li Shui, J. Krupka, "Dielectric measurement at microwave frequencies in high temperature range employing TE01d resonator technique", MMA2010, Warsaw September 1-3, 2010

  154. P. Łoś, A. Łukomska, S. Kowalska, J. Krupka, P. Zaprzalski and R. Jeziórska, "Metamaterials base on polymer dispersions of nanoparticles and particles of copper obtained by cathodic current pulse electrolysis", , MMA2010, Warsaw September 1-3, 2010

  155. J. Krupka, "Charakteryzacja elektrycznych właściwości grafenu i grafitu metodami mikrofalowymi", Zjazd Fizyków Polskich Lublin 2011

  156. J. Krupka and J. Mazierska, "Current developments in contactless measurements of high quality materials for microelectronics and nanotechnology employing dielectric resonator techniques", TENCON 2011, 10th Int. Conference on Trends and Developments in Converging Technologies November 21-24, Bali, Indonesia.

  157. J Krupka, "Measurements of dielectric magnetic conducting and superconducting materials with split post and single post dielectric resonators", EMINDA project and EMMA-Club Meeting LNE-Paris June 2012

  158. J. Krupka, "Resistivity and surface resistance measurements of semiconductors and Cconductors", EMINDA project and EMMA-Club Meeting Warsaw December 2012

  159. J. Krupka, "Measurements on ceramics and thin films", EMINDA project and EMMA-Club Meeting Ljubljana June 2012

  160. J. Krupka, "Substrate Measurements with Split Post Dielectric Resonator, Workshop Introduction to Advanced Dielectric Measurement Techniques", IMS 2012, Montreal, Canada, 17-22 June 2012

  161. J. Krupka, "Contactless methods of both conductivity and sheet resistance measurements of semiconductor crystals, wafers and epitaxial films deposited on semi-insulating substrates", ICCGE 2013